Tutorials

  • Introduction to Automatic Test Systems

    Monday, September 15
    8:00AM-Noon 
    (Baltimore 1)

    In this tutorial, the design process for Automated Test Systems is presented using standard systems engineering principles. No prior knowledge of ATE, ATS, or TPS development is assumed. A general familiarity with electronic testing techniques is a prerequisite for a full understanding of the material presented. This class will present a series of reference designs as a starting point for ATS and TPS development. Proposed design stages are explained in view of the typical division between hardware and software for the ATS. The process in which design recommendations are made can make the development of future systems easier. Thus, central of this tutorial is helping design teams to consider important aspects in decisions taken along the development process and keeping these decisions linked to the test requirements defined in initial development stages.

     


     

  • Cybersecurity for ATS

    Monday, September 15
    8:00AM-Noon
    Baltimore 2

    This tutorial session covers the definitions and relationships between various cybersecurity guidelines as they concern test and test equipment. The first section will discuss cybersecurity terminology and definitions. The second will focus on the relationships between the various steps of the National Institute of Standards and Technology (NIST) Risk Management Framework (RMF) used by many programs to guide cybersecurity approach and includes a discussion other the NIST Special Publication 800-series General Information items that affect Automatic Test Systems (ATS). The final section provides an initial set of the best practices for Cybersecurity on ATS and an introduction to the Cybersecurity Maturity Model Certification (CMMC) efforts.

     


     

  • Diagnostics and Design for Built-In Test

    Monday, September 15
    1:00PM-5:00PM
    Baltimore 1

    With advancing technology and increasingly complex electronic systems, almost every test approach has had to settle for lower fault coverage, more challenges in making diagnoses, and increased cost in developing test and diagnosis solutions. Today’s production and maintenance test engineers need to get involved with embedded test, diagnostics, and Design for Testability (DFT) enabled designs while utilizing advanced methodologies to keep pace with the growth in complexity; however, the details of how best to utilize these test methodologies often remain a mystery. This tutorial provides a comprehensive overview of the Built-In-Test & Diagnostics challenges and solutions. The Design for Built-In Test section of the tutorial introduces terminology and concepts. Various implementation issues are addressed as the tutorial moves through test strategies, circuit implementation, and test methodologies. The diagnostics section of this tutorial provides and overview of traditional and recent approaches to system-level diagnosis and prognosis. The emphasis is placed on different system modeling approaches and the algorithms that can be applied using resulting models.

  • Modular Open Systems Architecture and Standardization in Automatic Test Systems

    Monday, September 15
    1:00PM-5:00PM
    Baltimore 2

    This tutorial focuses on the application of Modular Open Systems Architecture (MOSA) principles and industry standards to ensure the long-term maintainability of Automatic Test Systems (ATS). The tutorial is intended for systems engineers who need to develop or modernize standards-based open ATS architectures, as well as application engineers who need to make effective use of industry standards.

    You will learn how modular design and open interfaces enable the replacement of obsolete hardware and software ATS components, while preserving the investments made in Test Program Sets (TPSs). You will also learn how legacy TPSs can be rehosted to modern ATSs and converted to modern programming languages.

    We will study two examples of ATS open architecture specifications, the US DoD ATS Framework and UK MOD DefStan 66-31 Part 8.

    We will explore the historical lineage of ATS standards for hardware, software, and data, highlighting the continuity of design principles for instrument interchangeability and signal-based, UUT-oriented test programming.

    Finally, we will look towards the future, discovering how UUT design standards such as SysML and EDIF enable digital transformation scenarios for UUT through-life support.